Four Probe Apparatus


Widely acclaimed as an efficient and effective manufacturer and supplier, we are engaged in Four Probe Apparatus. The four point probe method is the most common way to measure a semiconductor material’s resistivity. Two of the probes are used to source current and the other two probes are used to measure voltage. The inner probes draw no current because of the high input impedance voltmeter in the circuit in a four probe apparatus.

Features:

  • Leakage resistant surface
  • Digital panel meter
  • Constant current generator